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Autor/in | Yen, Wendy M. |
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Titel | Obtaining Maximum Likelihood Trait Estimates from Number-Correct Scores for the Three-Parameter Logistic Model. |
Quelle | In: Journal of Educational Measurement, 21 (1984) 2, S.93-111Infoseite zur Zeitschrift |
Sprache | englisch |
Dokumenttyp | gedruckt; Zeitschriftenaufsatz |
Schlagwörter | Achievement Tests; Error of Measurement; Estimation (Mathematics); Latent Trait Theory; Mathematical Models; Maximum Likelihood Statistics; Scores; Scoring; Statistical Analysis; True Scores |
Abstract | A procedure for obtaining maximum likelihood trait estimates from number-correct (NC) scores for the three-parameter logistic model is presented. It produces an NC score to trait estimate conversion table. Analyses in the estimated true score metric confirm the conclusions made in the trait metric. (Author/DWH) |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |