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Autor/inn/en | Hartig, Johannes; Frey, Andreas; Nold, Gunter; Klieme, Eckhard |
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Titel | An Application of Explanatory Item Response Modeling for Model-Based Proficiency Scaling |
Quelle | In: Educational and Psychological Measurement, 72 (2012) 4, S.665-686 (22 Seiten)Infoseite zur Zeitschrift
PDF als Volltext |
Sprache | englisch |
Dokumenttyp | gedruckt; online; Zeitschriftenaufsatz |
ISSN | 0013-1644 |
DOI | 10.1177/0013164411430707 |
Schlagwörter | Item Response Theory; Models; Methods; Computation; Comparative Analysis; Test Items; Difficulty Level; Scaling; Prediction; Reading Comprehension; English (Second Language); Reading Tests; Language Tests; Foreign Countries; Germany Item-Response-Theorie; Analogiemodell; Method; Methode; Test content; Testaufgabe; Schwierigkeitsgrad; Scale construction; Skalenkonstruktion; Vorhersage; Leseverstehen; English as second language; English; Second Language; Englisch als Zweitsprache; Lesetest; Language test; Sprachtest; Ausland; Deutschland |
Abstract | The article compares three different methods to estimate effects of task characteristics and to use these estimates for model-based proficiency scaling: prediction of item difficulties from the Rasch model, the linear logistic test model (LLTM), and an LLTM including random item effects (LLTM+e). The methods are applied to empirical data from a German large-scale study of reading comprehension in English as a foreign language (N = 10,543). A priori defined task characteristics were used as predictors for item difficulty; the estimated effects were used to define thresholds between proficiency levels. The comparison of results indicates that the LLTM is too restrictive; the Rasch model and the LLTM+e yield similar results in terms of implications for scale anchoring. (Contains 1 note, 6 tables, and 1 figure.) (As Provided). |
Anmerkungen | SAGE Publications. 2455 Teller Road, Thousand Oaks, CA 91320. Tel: 800-818-7243; Tel: 805-499-9774; Fax: 800-583-2665; e-mail: journals@sagepub.com; Web site: http://sagepub.com |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
Update | 2017/4/10 |