Harsh Parenting and Child Externalizing Behavior: Skin Conductance Level Reactivity as a Moderator

Autor/inn/en	Erath, Stephen A.; El-Sheikh, Mona; Cummings, E. Mark
Titel	Harsh Parenting and Child Externalizing Behavior: Skin Conductance Level Reactivity as a Moderator
Quelle	In: Child Development, 80 (2009) 2, S.578-592 (15 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	0009-3920
DOI	10.1111/j.1467-8624.2009.01280.x
Schlagwörter	Antisocial Behavior; Females; Parenting Styles; Child Rearing; Child Development; Behavior Problems; Correlation; Children; Mothers; Fathers; Attitude Measures; Social Influences; Emotional Response; Problem Solving; Comparative Analysis; Gender Differences + Suchen Sie Ihr Suchwort? Weibliches Geschlecht; Kindererziehung; Kindesentwicklung; Korrelation; Child; Kind; Kinder; Mother; Mutter; Sozialer Einfluss; Emotionales Verhalten; Problemlösen; Geschlechterkonflikt
Abstract	Skin conductance level reactivity (SCLR) was examined as a moderator of the association between harsh parenting and child externalizing behavior. Participants were 251 boys and girls (8-9 years). Mothers and fathers provided reports of harsh parenting and their children's externalizing behavior; children also provided reports of harsh parenting. SCLR was assessed in response to a socioemotional stress task and a problem-solving challenge task. Regression analyses revealed that the association between harsh parenting and externalizing behavior was stronger among children with lower SCLR, as compared to children with higher SCLR. SCLR may be a more robust moderator among boys compared to girls. Results are discussed with regard to theories on antisocial behavior and multiple-domain models of child development. (As Provided).
Anmerkungen	Blackwell Publishing. 350 Main Street, Malden, MA 02148. Tel: 800-835-6770; Tel: 781-388-8599; Fax: 781-388-8232; e-mail: customerservices@blackwellpublishing.com; Web site: http://www.blackwellpublishing.com/jnl_default.asp
Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2017/4/10