Literaturnachweis - Detailanzeige
Autor/inn/en | Bickel, Peter; Buyske, Steven; Chang, Huahua; Ying, Zhiliang |
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Titel | On Maximizing Item Information and Matching Difficulty with Ability. |
Quelle | In: Psychometrika, 66 (2001) 1, S.69-77 |
Sprache | englisch |
Dokumenttyp | gedruckt; Zeitschriftenaufsatz |
ISSN | 0033-3123 |
Schlagwörter | Ability; Difficulty Level; Item Response Theory; Test Construction; Test Items; Validity |
Abstract | Examined the assumption that matching difficulty levels of test items with an examinee's ability makes a test more efficient and challenged this assumption through a class of one-parameter item response theory models. Found the validity of the fundamental assumption to be closely related to the van Zwet tail ordering of symmetric distributions (W. van Zwet, 1964). (SLD) |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |