Literaturnachweis - Detailanzeige
Autor/inn/en | Silverman, Wayne; Krinsky-McHale, Sharon J.; Lai, Florence; Diana Rosas, H.; Hom, Christy; Doran, Eric; Pulsifer, Margaret; Lott, Ira; Schupf, Nicole |
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Titel | Evaluation of the National Task Group-Early Detection Screen for Dementia: Sensitivity to 'Mild Cognitive Impairment' in Adults with Down Syndrome |
Quelle | In: Journal of Applied Research in Intellectual Disabilities, 34 (2021) 3, S.905-915 (11 Seiten)Infoseite zur Zeitschrift
PDF als Volltext |
Zusatzinformation | ORCID (Silverman, Wayne) |
Sprache | englisch |
Dokumenttyp | gedruckt; online; Zeitschriftenaufsatz |
ISSN | 1360-2322 |
DOI | 10.1111/jar.12849 |
Schlagwörter | Screening Tests; Dementia; Mild Intellectual Disability; Down Syndrome; Adults; Accuracy; Identification |
Abstract | Background: The accuracy of the National Task Group-Early Detection Screen for Dementia (NTG-EDSD) was evaluated in a sample of 185 adults with Down syndrome (DS), emphasizing 'mild cognitive impairment (MCI-DS)'. Method: Knowledgeable informants were interviewed with the NTG-EDSD, and findings were compared to an independent dementia status rating based on consensus review of detailed assessments of cognition, functional abilities and health status (including physician examination). Results: Results indicated that sections of the NTG-EDSD were sensitive to MCI-DS, with one or more concerns within the 'Memory' or 'Language and Communication' domains being most informative. Conclusions: The NTG-EDSD is a useful tool for evaluating dementia status, including MCI-DS. However, estimates of sensitivity and specificity, even for detecting frank dementia, indicated that NTG-EDSD findings need to be supplemented by additional sources of relevant information to achieve an acceptable level of diagnostic/screening accuracy. (As Provided). |
Anmerkungen | Wiley. Available from: John Wiley & Sons, Inc. 111 River Street, Hoboken, NJ 07030. Tel: 800-835-6770; e-mail: cs-journals@wiley.com; Web site: https://www.wiley.com/en-us |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
Update | 2024/1/01 |