Literaturnachweis - Detailanzeige
Autor/inn/en | Eckstein, Max A.; Noah, Harold J. |
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Institution | Yale University (New Haven, Conn.) |
Titel | Secondary school examinations. International perspectives on policies and practice. |
Quelle | New Haven, Conn. u.a.: Yale Univ. Pr. (1993), XI, 283 S. |
Beigaben | Abbildungen |
Zusatzinformation | Inhaltsverzeichnis |
Sprache | englisch |
Dokumenttyp | gedruckt; Monographie |
ISBN | 0-300-05393-2 |
Schlagwörter | Prüfungsordnung; Schule; Sekundarschule; Schüler; Abschlussprüfung; Prüfung; Prüfungsarbeit; Schulerfolg; Schülerleistung; Berufschance; Hochschulreife; Internationaler Vergleich; Leistung; Leistungsmessung; China; Deutschland-BRD; Frankreich; Großbritannien; Japan; Schweden; Sowjetunion; USA |
Abstract | Most industrialized countries require students to take extensive examinations at the end of their secondary schooling to determine whether they have satisfactorily met national criteria and are qualified for further education or specialized training.... [The authors] compare end-of- schooling examination systems in eight countries ... Their study casts light on broad cultural differences in educational emphases and standards as well as on more specific reasons for national differences in achievement. The authors review the eight examination systems, and they compare the format, content, and style of the examination questions, as well as how each country mesures academic success and controls the examinations, how the examinations affect each educational system, and how the results affect students' subsequent social status and employment opportunities. (DIPF/Umschlagtext). |
Erfasst von | DIPF | Leibniz-Institut für Bildungsforschung und Bildungsinformation, Frankfurt am Main |
Update | 1998_(CD) |